共 50 条
- [42] Simultaneous Measurement of Refractive Index and Thickness by Low Coherence Interferometry Considering Chromatic Dispersion of Index [J]. Optical Review, 2000, 7 : 468 - 472
- [44] Remote and In-Situ Calibration of Linear Scale by Low-Coherence Tandem Interferometer [J]. 2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9, 2008, : 456 - +
- [45] Spectrometer-based refractive index and dispersion measurement using low-coherence interferometry with confocal scanning [J]. OPTICS EXPRESS, 2018, 26 (03): : 3604 - 3617
- [47] A practical measurement system for determination of refractive index and thickness using the low coherence interferometry [J]. OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99), 1999, 3740 : 26 - 29
- [48] Measurement of thicknesses and refractive indices by low-coherence confocal interferometric microscope [J]. SELECTED PAPER FROM INTERNATIONAL CONFERENCE ON OPTICS AND OPTOELECTRONICS '98: SILVER JUBILEE SYMPOSIUM OF THE OPTICAL SOCIETY OF INDIA, 1999, 3729 : 371 - 383
- [50] New remote length measurements with optical fiber using a low-coherence tandem interferometer [J]. OPTICS FOR THE QUALITY OF LIFE, PTS 1 AND 2, 2003, 4829 : 930 - 931