Low-coherence tandem interferometer for measurement of group refractive index without knowledge of the thickness of the test sample

被引:43
|
作者
Hirai, A [1 ]
Matsumoto, H [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058563, Japan
关键词
D O I
10.1364/OL.28.002112
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new low-coherence interferometric technique is proposed for measuring the group refractive indices of dispersive samples with high accuracy. A tandem configuration of interferometers is used to compensate for the asymmetrical distortion of interferograms that results from the broad spectrum of the light source. The group refractive index can be measured without knowledge of the geometrical thickness of the sample under test. The proposed technique can successfully measure even a thick sample. Computer calculations have shown the effectiveness of the proposed technique, which was verified by preliminary experiments; the difference between the experimental result and the catalog data was 7 X 10(-4). (C) 2003 Optical Society of America.
引用
收藏
页码:2112 / 2114
页数:3
相关论文
共 50 条
  • [31] THICKNESS AND REFRACTIVE INDEX MEASUREMENT OF A LAMINA WITH A MICHELSON INTERFEROMETER
    JEPPESEN, MA
    TAYLOR, AM
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1966, 56 (04) : 451 - &
  • [32] Absolute measurement of gauge block without wringing using tandem low-coherence interferometry
    Winarno, Agustinus
    Takahashi, Satoru
    Hirai, Akiko
    Takamasu, Kiyoshi
    Matsumoto, Hirokazu
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2012, 23 (12)
  • [33] In-Situ Calibration of a Translation Stage by Low-Coherence Tandem Interferometer
    Hirai, A.
    Kitta, J.
    Matsumoto, H.
    [J]. 2009 CONFERENCE ON LASERS AND ELECTRO-OPTICS AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2009), VOLS 1-5, 2009, : 1559 - +
  • [34] Measurement of transmitted wavefront error and homogeneity with a low-coherence interferometer
    Freischlad, Klaus
    [J]. OPTIFAB 2021, 2021, 11889
  • [35] Low-Coherence Fiber Differential Interferometer With Adjustable Measurement Range
    Zhen, Shenglai
    Chen, Jian
    Li, Hui
    Wang, Xiaoguang
    Zhang, Bo
    Yu, Benli
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 2015, 27 (08) : 895 - 898
  • [36] Simultaneous measurement of refractive index and thickness of transparent plates by low coherence interferometry
    Ohmi, M
    Shiraishi, T
    Tajiri, H
    Haruna, M
    [J]. OPTICAL REVIEW, 1997, 4 (04) : 507 - 515
  • [37] Simultaneous Measurement of Refractive Index and Thickness of Transparent Plates by Low Coherence Interferometry
    Masato Ohmi
    Takehisa Shiraishi
    Hideyuki Tajiri
    Masamitsu Haruna
    [J]. Optical Review, 1997, 4 : 507 - 515
  • [38] Simultaneous measurement of the phase and group indices and the thickness of transparent plates by low-coherence interferometry
    Haruna, M
    Ohmi, M
    Mitsuyama, T
    Tajiri, H
    Maruyama, H
    Hashimoto, M
    [J]. OPTICS LETTERS, 1998, 23 (12) : 966 - 968
  • [39] Evaluation of optical thickness and refractive index of a layered sample by low coherence optical tomography
    Pratima, S
    Shubhada, K
    Sanjay, G
    [J]. APOC 2001: ASIA-PACIFIC OPTICAL AND WIRELESS COMMUNICATIONS: OPTICAL FIBER AND PLANAR WAVEGUIDE TECHNOLOGY, 2001, 4579 : 355 - 359
  • [40] Thin-film thickness profile measurement using a Mirau-type low-coherence interferometer
    Ghim, Young-Sik
    Rhee, Hyug-Gyo
    Yang, Ho-Soon
    Lee, Yun-Woo
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2013, 24 (07)