The Dresden EBIT: An ion source for materials research and technological applications of low-energy highly charged ions

被引:10
|
作者
Werner, T
Zschornack, G
Grossmann, F
Ovsyannikov, VP
Ullmann, F
机构
[1] Tech Univ Dresden, Inst Kern & Teilchenphys, D-01069 Dresden, Germany
[2] LEYBOLD Syst & Serv GmbH Dresden, D-01109 Dresden, Germany
[3] Joint Inst Nucl Res, LHE, Dubna, Russia
关键词
highly charged ions; electron beam ion trap; X-ray spectroscopy; ion extraction; technological applications;
D O I
10.1016/S0168-583X(01)00515-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We report on a room temperature electron beam ion trap (DEBIT: Dresden EBIT). The construction of the DEBIT allows it to produce dense electron beams with current densities of at least 500 A cm(-2) and an ionization factor of 5 x 10(21) cm(-2) for electron beam energies up to 15 keV. Ions like Fe26+. Kr34+. Xe49+ and Hg70+ have been detected by X-ray spectrometry. The developed device has a high potential for investigations in nanomechanics. potential sputtering, information technology, ion beam lithography, etc., as it was demonstrated by different authors in studies utilizing a cryogenic EBIT or ECR ion sources. To enable adequate investigations a first compact ion extraction system for the DEBIT is described. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:260 / 264
页数:5
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