All-Silicon Waveguide Avalanche Photodetectors With Ultrahigh Gain-Bandwidth Product and Low Breakdown Voltage

被引:21
|
作者
Zhu, Haike [1 ]
Zhou, Linjie [1 ]
Zhou, Yanyang [1 ]
Wu, Qianqian [1 ]
Li, Xinwan [1 ]
Chen, Jianping [1 ]
机构
[1] Shanghai Jiao Tong Univ, Dept Elect Engn, State Key Lab Adv Opt Commun Syst & Networks, Shanghai 200240, Peoples R China
基金
中国国家自然科学基金;
关键词
Avalanche photodetector (APD); high-speed integrated optoelectronics; photodiodes; surface state absorption (SSA); silicon photonics; 1550; NM; PHOTODIODES; DEFECT; TIME; DEPENDENCE; NOISE;
D O I
10.1109/JSTQE.2014.2328233
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We investigate the avalanche effect in 250 mu m long silicon waveguides integrated with periodically interleaved p-n junctions. The surface state absorption is enhanced by reducing the waveguide width. Upon a bias voltage of -5.9 V, the measured responsivity is 2.33 A/W with a dark current of 0.78 mu A. The avalanche gain is 284 and the 3-dB bandwidth is 3.6 GHz, leading to an ultrahigh gain-bandwidth product of 1.02 THz. The avalanche photocurrent is stable with time below -6 V when similar to 1 mW on-chip optical power is launched. The photodetector has a linear response to optical power and can be readily integrated with other silicon photonic devices.
引用
收藏
页码:226 / 231
页数:6
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