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- [5] Effect of annealing conditions on the structural and physical properties of Si-based Pb(Zr0.4, Ti0.6)O3 ferroelectric capacitors with Ti-Al film as a barrier layer Rengong Jingti Xuebao/Journal of Synthetic Crystals, 2010, 39 (01): : 62 - 66
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- [9] On the suppression of hydrogen degradation in Pb Zr0.4 Ti 0.6 O3 ferroelectric capacitors with Pt Ox top electrode Huang, C.-K., 1600, American Institute of Physics Inc. (98):
- [10] POLARIZATION FATIGUE CHARACTERISTICS OF SOL-GEL FERROELECTRIC PB(ZR0.4TI0.6)O3 THIN-FILM CAPACITORS JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (7A): : 3996 - 4002