POLARIZATION FATIGUE CHARACTERISTICS OF SOL-GEL FERROELECTRIC PB(ZR0.4TI0.6)O3 THIN-FILM CAPACITORS

被引:151
|
作者
MIHARA, T
WATANABE, H
DEARAUJO, CAP
机构
[1] SYMETRIX CORP,COLORADO SPRINGS,CO 80918
[2] UNIV COLORADO,COLORADO SPRINGS,CO 80918
关键词
FERROELECTRICS; THIN FILMS; PZT; FATIGUE; POLARIZATION DEGRADATION; BIPOLAR PULSES; HYSTERESIS LOOPS; ELECTRIC FIELD; TEMPERATURE; FATIGUE MODEL;
D O I
10.1143/JJAP.33.3996
中图分类号
O59 [应用物理学];
学科分类号
摘要
Fatigue characteristics of PbZr0.4Ti0.6O3 (PZT) thin-film capacitors made by sol-gel spin coating have been evaluated using hysteresis measurement by bipolar continuous pulses. The following three stages were found according to the cumulative polarization switching cycles: (1) slow fatigue stage at the initial switching cycles, (2) logarithmic fatigue stage at middle switching cycles which is recognized in general, (3) saturated stage at extremely large number of switching cycles. The decays of the nonswitched parts started in the middle of the logarithmic fatigue stage. The switching cycles at half of the initial remanent polarization are exponentially proportional to reverse electric field, and the degradation is explained in terms of an ''electric-field-activating process'' with an accelerating factor of 1.2 x 10(-3) in units of decade kV/cm on our PZT thin-film capacitors. Temperature dependence of fatigue characteristics was unexpectedly small and activation energy was estimated to be 0.051 eV. A plausible fatigue model is proposed in which injected charge initiates the polarization fatigue.
引用
收藏
页码:3996 / 4002
页数:7
相关论文
共 50 条
  • [1] DEPOLARIZATION CHARACTERISTICS IN SOL-GEL FERROELECTRIC PB(ZR0.4TI0.6)O-3 THIN-FILM CAPACITORS
    MIHARA, T
    YOSHIMORI, H
    WATANABE, H
    DEARAUJO, CAP
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (5A): : 2380 - 2388
  • [2] CHARACTERISTIC CHANGE DUE TO POLARIZATION FATIGUE OF SOL-GEL FERROELECTRIC PB(ZR0.4TI0.6)O-3 THIN-FILM CAPACITORS
    MIHARA, T
    WATANABE, H
    DEARAUJO, CAP
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9B): : 5281 - 5286
  • [3] ORIGIN OF DEPOLARIZATION IN SOL-GEL FERROELECTRIC PB(ZR0.4TI0.6)O-3 THIN-FILM CAPACITORS
    MIHARA, T
    YOSHIMORI, H
    WATANABE, H
    DEARAUJO, CAP
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (12A): : L1703 - L1706
  • [4] ELECTRONIC CONDUCTION CHARACTERISTICS OF SOL-GEL FERROELECTRIC PB(ZR0.4TI0.6)O-3 THIN-FILM CAPACITORS .2.
    MIHARA, T
    WATANABE, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (10): : 5674 - 5682
  • [5] Ferroelectric properties of highly (111) oriented Pb(Zr0.4Ti0.6)O3 thin films fabricated using sol-gel process
    Jung, HS
    No, JH
    Park, JS
    Hong, KS
    Lee, JK
    [J]. INTEGRATED FERROELECTRICS, 2004, 67 : 181 - 190
  • [6] Asymmetry in fatigue and recovery in ferroelectric Pb(Zr,Ti)O3 thin-film capacitors
    Chae, BG
    Park, CH
    Yang, YS
    Jang, MS
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (14) : 2135 - 2137
  • [7] Mechanisms for retention loss in ferroelectric Pt/Pb(Zr0.4Ti0.6)O3/Pt capacitors
    Kang, BS
    Yoon, JG
    Kim, DJ
    Noh, TW
    Song, TK
    Lee, YK
    Lee, JK
    Park, YS
    [J]. APPLIED PHYSICS LETTERS, 2003, 82 (13) : 2124 - 2126
  • [8] The effect of excess Pb content on the crystallization and electrical properties in sol-gel derived Pb (Zr0.4Ti0.6)O3 thin films
    Yang, JK
    Kim, WS
    Park, HH
    [J]. THIN SOLID FILMS, 2000, 377 (377-378) : 739 - 744
  • [9] Effective orientation control of Pb(Zr0.4Ti0.6)O3 thin films using a new Ti/Pb(Zr0.4Ti0.6)O3 seeding layer
    Moon, BK
    Arisumi, O
    Hornik, K
    Bruchhaus, R
    Itokawa, H
    Hilliger, A
    Zhuang, H
    Egger, U
    Nakazawa, K
    Yamazaki, S
    Ozaki, T
    Nagel, N
    Kunishima, I
    Yamakawa, K
    Beitel, G
    [J]. FERROELECTRIC THIN FILMS XII, 2004, 784 : 177 - 188
  • [10] Ferroelectric properties of very thin Pb(Zr0.4Ti0.6)O3 film determined by Kelvin force microscope
    Jang, DM
    Heo, J
    Yi, IS
    Chung, IS
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (11B): : 6739 - 6742