Effective quality factor tuning mechanisms in micromechanical resonators

被引:112
|
作者
Miller, James M. Lehto [1 ]
Ansari, Azadeh [2 ]
Heinz, David B. [1 ]
Chen, Yunhan [1 ]
Flader, Ian B. [1 ]
Shin, Dongsuk D. [1 ]
Villanueva, L. Guillermo [3 ]
Kenny, Thomas W. [1 ]
机构
[1] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30309 USA
[3] Ecole Polytech Fed Lausanne, Adv NEMS Grp, CH-1015 Lausanne, Switzerland
来源
APPLIED PHYSICS REVIEWS | 2018年 / 5卷 / 04期
基金
美国国家科学基金会; 瑞士国家科学基金会;
关键词
FORCE MICROSCOPE CANTILEVERS; RESOLVED-SIDE-BAND; PARAMETRIC AMPLIFICATION; BACK-ACTION; THERMAL NOISE; ULTRASONIC-ATTENUATION; CAVITY OPTOMECHANICS; MEMS IMPLEMENTATION; FACTOR ENHANCEMENT; SELF-OSCILLATION;
D O I
10.1063/1.5027850
中图分类号
O59 [应用物理学];
学科分类号
摘要
Quality factor (Q) is an important property of micro- and nano-electromechanical (MEM/NEM) resonators that underlie timing references, frequency sources, atomic force microscopes, gyroscopes, and mass sensors. Various methods have been utilized to tune the effective quality factor of MEM/NEM resonators, including external proportional feedback control, optical pumping, mechanical pumping, thermal-piezoresistive pumping, and parametric pumping. This work reviews these mechanisms and compares the effective Q tuning using a position-proportional and a velocity-proportional force expression. We further clarify the relationship between the mechanical Q, the effective Q, and the thermomechanical noise of a resonator. We finally show that parametric pumping and thermal-piezoresistive pumping enhance the effective Q of a micromechanical resonator by experimentally studying the thermomechanical noise spectrum of a device subjected to both techniques. (C) 2018 Author(s).
引用
收藏
页数:31
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