Experimental evidence of differences in the electronic properties of an insulating and a conducting SrTiO3/LaAlO3 interface is provided by soft x-ray spectroscopies. While core level photoemission measurements show that only at the conducting interface Ti ions with 3+ ionization state are present, by using resonant photoemission and x-ray absorption spectroscopies, it is shown that in both samples in-gap states with a Ti 3d character are present, but their density is higher at the conducting interface. (C) 2011 American Institute of Physics. [doi:10.1063/1.3549177]
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Tokyo Inst Technol, Secure Mat Ctr, Mat & Struct Lab, Midori Ku, Yokohama, Kanagawa 2268503, JapanTokyo Inst Technol, Secure Mat Ctr, Mat & Struct Lab, Midori Ku, Yokohama, Kanagawa 2268503, Japan
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Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USAStanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
Sanders, T. D.
Gray, M. T.
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Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAStanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
Gray, M. T.
Wong, F. J.
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USAStanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
Wong, F. J.
Suzuki, Y.
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Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USAStanford Univ, Dept Appl Phys, Stanford, CA 94305 USA