Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons

被引：79
|
作者：
Kim, K. Y. [1 ]
Yellampalle, B. [1 ]
Taylor, A. J. [1 ]
Rodriguez, G. [1 ]
Glownia, J. H. [1 ]
机构：
[1] Los Alamos Natl Lab, Ctr Integrated Nanotechnol, Los Alamos, NM 87545 USA
来源：
OPTICS LETTERS | 2007年 / 32卷 / 14期
关键词：
SPECTROSCOPY; RESOLUTION; TIME;
D O I：
10.1364/OL.32.001968
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A single-shot measurement of terahertz electromagnetic pulses is implemented using two-dimensional electro-optic imaging with dual echelon optics. The reported embodiment produces sequentially delayed multiprobe beamlets, routinely providing a time window of > 10 ps with similar to 25 fs temporal step sizes. Because of its simplicity and robustness, the technique is ideally suited for real-time ultrashort relativistic electron bunch characterization. 2007 Optical Society of America.
引用
收藏
页码：1968 / 1970
页数：3
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