TWO-DIMENSIONAL MAPPING OF ELECTRO-OPTIC PHASE RETARDATION IN PUT BY DIGITAL HOLOGRAPHY

被引：0
|
作者：
Shi, Yan [1 ]
Zheng, Shilie [1 ]
Zhang, Xianmin [1 ]
Jin, Xiaofeng [1 ]
Zou, Yingyin Kevin [2 ]
机构：
[1] Zhejiang Univ, Dept Informat Sci & Elect Engn, Hangzhou 310027, Peoples R China
[2] Boston Appl Technol, Woburn, MA 01801 USA
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2008年 / 50卷 / 12期
基金：
中国国家自然科学基金;
关键词：
PLZT; digital holography; phase measurement; electro-optic;
D O I：
10.1002/mop.23869
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A two-dimensional mapping of the phase retardation induced by the electro-optic effect in lead lanthanum zirconate titanate (PLZT) is demonstrated by use of a digital holography method. This technique provides information of spatially resolved optical path difference in PLZT when a linearly rising voltage ramp is applied and can be used to evaluate the uniformity of a ferroelectric ceramic's electro-optic properties and qualities. Besides, this technique could also be an alternative method to visualize the domain evolution in PLZT which is very important for the PLZT based photonic devices with help of a high speed CCD camera. (C) 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 50: 3093-3097, 2008; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23869
引用
收藏
页码：3093 / 3097
页数：5
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