BIST vs. ATE for testing system-on-a-chip

被引：0
|
作者：
Kelly, N [1 ]
机构：
[1] LTX Corp, Westwood, MA 02090 USA
来源：
INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS | 1998年
关键词：
D O I：
10.1109/TEST.1998.743347
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1147 / 1147
页数：1
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