BIST vs. ATE for testing system-on-a-chip

被引：0

作者：

Kelly, N ^{[1
]}

机构：

[1] LTX Corp, Westwood, MA 02090 USA

来源：

INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/TEST.1998.743347

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1147 / 1147

页数：1

共 50 条

[1] Integrated ATE handles system-on-a-chip testing
不详
COMPUTER DESIGN, 1997, 36 (12): : 38 - 38
[2] BIST vs. ATE: Need a different vehicle?
Sunter, S
INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, : 1148 - 1148
[3] Sharing BIST with multiple cores for system-on-a-chip
Liang, HG
Jiang, CY
ATS 2003: 12TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2003, : 418 - 423
[4] System-on-a-Chip vs. System-in-a-Package: Design and interconnection issues (invited)
Sakurai, T
ADVANCED METALLIZATION CONFERENCE 2003 (AMC 2003), 2004, : 3 - 9
[5] Microprocessor based self schedule and parallel BIST for system-on-a-chip
Wang, DH
Fan, XY
Gao, DY
Zhang, SB
An, JF
EMBEDDED SOFTWARE AND SYSTEMS, PROCEEDINGS, 2005, 3820 : 299 - 309
[6] Hybrid BIST for system-on-a-chip using an embedded FPGA core
Zeng, G
Ito, H
22ND IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2004, : 353 - 358
[7] A design strategy for system-on-a-chip testing
Bennetts, B
ELECTRONIC PRODUCTS MAGAZINE, 1997, 40 (01): : 57 - 59
[8] Design strategy for system-on-a-chip testing
Electronic Products (Garden City, New York), 1997, 40 (01):
[9] Testing system-on-a-chip using artificial immune system
Souza, CP
Freire, RCS
Assis, FM
IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS, 2005, : 61 - 64
[10] System-on-a-chip?
Schmalzel, JL
IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, 2001, 4 (04) : 61 - 62