Symbolic test generation using a temporal logic with constrained events

被引：0
|
作者：
Liu, Daguang [1 ,3 ]
Wu, Peng [2 ]
Lin, Huimin [1 ]
机构：
[1] Chinese Acad Sci, Inst Software, Comp Sci Lab, Beijing 100080, Peoples R China
[2] Ecole Polytech, CNRS, LIX, F-91128 Palaiseau, France
[3] Chinese Acad Sci, Grad Sch, Beijing 100044, Peoples R China
来源：
FORMAL METHODS AND HYBRID REAL-TIME SYSTEMS | 2007年 / 4700卷
基金：
美国国家科学基金会;
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
A temporal logic with constrained event modallities, TLCE, is proposed to represent test purposes for testing concurrent programs. The logic is capable can express not only temporal relationships among input and output events, but also data dependencies between event parameters. A TLCE-based test generation algorithm is developed to automatically derive symbolic test cases that incorporate given data dependency constraints as verdict conditions. The advantage of the approach is demonstrated with a case study on a cache coherence protocol.
引用
收藏
页码：467 / +
页数：2
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