Conduction Mechanisms and Environmental Sensitivity of Solution-Processed Silicon Nanoparticle Layers for Thin-Film Transistors

Room-temperature, solution-processed, silicon nanoparticle thin films show significant gating with distinct hysteresis in their current-voltage characteristics. Device performance strongly depends on measurement environment and charge transport is determined by particle surfaces. Particle encapsulation with polymethyl methacrylate or Al 2O 3 reduces hysteresis and device sensitivity against environmental influences. Both Al 2O 3 coating and UV exposure during measurements alter current transport and enhance conductivity, providing evidence for surface-dominated transport. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.