3D RRAM DESIGN AND BENCHMARK WITH 3D NAND FLASH

被引:0
|
作者
Chen, Pai-Yu [1 ]
Xu, Cong [2 ]
Xie, Yuan [2 ]
Yu, Shimeng [1 ]
机构
[1] Arizona State Univ, Tempe, AZ 85283 USA
[2] Penn State Univ, University Pk, PA 16802 USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The monolithic 3D integration of resistive switching random access memory (RRAM) is one attractive approach to build high-density non-volatile memory. In this paper, the design considerations of 3D vertical RRAM architecture are presented from the device, circuit to system level. Due to the voltage drop and sneak path problem, the sub-array size of the 3D NAND is still limited as compared with that of the 3D NAND. To be cost-competitive with the 3D NAND, high on-state resistance, high I-V nonlinearity and low interconnect resistivity is required to enable Mb 3D RRAM sub-array. Although the 3D RRAM has disadvantage in array efficiency (consequently in cost per bit) than the 3D NAND, the 3D RRAM outperforms the 3D NAND In throughput performance at system-level.
引用
收藏
页数:4
相关论文
共 50 条
  • [21] Design and Optimization Methodology for 3D RRAM Arrays
    Deng, Yexin
    Chen, Hong-Yu
    Gao, Bin
    Yu, Shimeng
    Wu, Shih-Chieh
    Zhao, Liang
    Chen, Bing
    Jiang, Zizhen
    Liu, Xiaoyan
    Hou, Tuo-Hung
    Nishi, Yoshio
    Kang, Jinfeng
    Wong, H. -S. Philip
    [J]. 2013 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2013,
  • [22] 存储器大战——RRAM对决3D NAND闪存
    沈建苗
    [J]. 微电脑世界, 2013, (10) : 12 - 13
  • [23] Investigation of the Connection Schemes between Decks in 3D NAND Flash
    Jia, Jianquan
    Jin, Lei
    You, Kaikai
    Zhu, Anyi
    [J]. MICROMACHINES, 2023, 14 (09)
  • [24] Modeling of Threshold Voltage Distribution in 3D NAND Flash Memory
    Liu, Weihua
    Wu, Fei
    Zhou, Jian
    Zhang, Meng
    Yang, Chengmo
    Lu, Zhonghai
    Wang, Yu
    Xie, Changsheng
    [J]. PROCEEDINGS OF THE 2021 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2021), 2021, : 1729 - 1732
  • [25] Characterizing and Optimizing LDPC Performance on 3D NAND Flash Memories
    Li, Qiao
    Chen, Yu
    Wu, Guanyu
    Du, Yajuan
    Ye, Min
    Gan, Xinbiao
    Zhang, Jie
    Shen, Zhirong
    Shu, Jiwu
    Xue, Chun
    [J]. ACM Transactions on Architecture and Code Optimization, 2024, 21 (03)
  • [26] A Study of Invalid Programming in 3D QLC NAND Flash Memories
    Dang, Hongyang
    Yao, Xiangyu
    Wan, Zheng
    Li, Qiao
    [J]. PROCEEDINGS OF THE 2023 15TH ACM WORKSHOP ON HOT TOPICS IN STORAGE AND FILE SYSTEMS, HOTSTORAGE 2023, 2023, : 73 - 79
  • [27] Enabling 3D NAND Trench Cells for Scaled Flash Memories
    Rachidi, S.
    Ramesh, S.
    Breuil, L.
    Tao, Z.
    Verreck, D.
    Donadio, G. L.
    Arreghini, A.
    Van den Bosch, G.
    Rosmeulen, M.
    [J]. 2023 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW, 2023, : 121 - 124
  • [28] A Review of Cell Operation Algorithm for 3D NAND Flash Memory
    Park, Jong Kyung
    Kim, Sarah Eunkyung
    [J]. APPLIED SCIENCES-BASEL, 2022, 12 (21):
  • [29] Selective Wet Etching Technology in 3D NAND Flash Manufacturing
    Zhou, Zihan
    Han, Silin
    Wu, Yunwen
    Hang, Tao
    Ling, Huiqin
    Guo, Jie
    Wang, Su
    Li, Ming
    [J]. 2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2023,
  • [30] 3D NAND Flash测试平台设计与实现
    黄圆
    楼向雄
    李振华
    [J]. 杭州电子科技大学学报(自然科学版), 2018, 38 (01) : 38 - 42