共 50 条
- [41] Chip/Package Co-Analysis of Thermo-Mechanical Stress and Reliability in TSV-based 3D ICs 2012 49TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2012, : 317 - 326
- [42] TSV-aware Interconnect Length and Power Prediction for 3D Stacked ICs PROCEEDINGS OF THE 2009 IEEE INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE, 2009, : 26 - 28
- [43] An Overview of Thermal Challenges and Opportunities for Monolithic 3D ICs GLSVLSI '19 - PROCEEDINGS OF THE 2019 ON GREAT LAKES SYMPOSIUM ON VLSI, 2019, : 439 - 444
- [44] DfT Techniques and Architectures for TSV-Based 3D-ICs: A Comparative Study PROCEEDINGS OF THE 18TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE MELECON 2016, 2016,
- [45] Metal Stack and Partitioning Exploration for Monolithic 3D ICs 2020 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2020), 2020, : 398 - 403
- [46] STA Compatible Backend Design Flow for TSV-based 3-D ICs PROCEEDINGS OF THE EIGHTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), 2017, : 186 - +
- [47] Thermal Modeling and Design Exploration for Monolithic 3D ICs PROCEEDINGS OF THE TWENTY THIRD INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2022), 2022, : 273 - 278
- [49] Thermal-aware TSV Repair for Electromigration in 3D ICs PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2016, : 1291 - 1296
- [50] High Density Backside Tungsten TSV for 3D Stacked ICs 2016 IEEE INTERNATIONAL 3D SYSTEMS INTEGRATION CONFERENCE (3DIC), 2016,