On-chip protection

被引：0
|
作者：
Chaine, M [1 ]
机构：
[1] Texas Instruments Inc, Dallas, TX 75265 USA
来源：
ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS - 1998 | 1998年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：383 / 383
页数：1
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