A GA-based static test compaction algorithm for sequential circuits

被引：0
|
作者：
Qiao, Jia Qing [1 ]
Fu, Ping [1 ]
Meng, Sheng Wei [1 ]
机构：
[1] Harbin Inst Technol, Automat Test & Control Inst, Harbin 150001, Peoples R China
来源：
ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS | 2007年
关键词：
test set compaction algorithm; static compaction; genetic algorithm;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper applies genetic algorithm (GA) in test compaction for sequential circuits. The algorithm compacts test set generated by ATPG (Automatic Test Pattern Generation) tool under the assumption that the test set can be partitioned into some sub-sequences, each containing redundant vectors that can not detect faults or perform state transition. The proposed algorithm removes these redundant vectors from the test set. Experimental results show that the GA-based algorithm can effectively reduce the size of test sets with acceptable computational cost and maintain the fault coverage of the original test set.
引用
收藏
页码：2531 / 2534
页数：4
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