2-transistor, 1.5-gate redundancy technology for color TFT-LCDs

被引:0
|
作者
Kawada, T [1 ]
Nakajima, H [1 ]
Kohda, S [1 ]
Sakai, S [1 ]
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, MUSASHINO ELECT COMMUN LAB, MUSASHINO, TOKYO 180, JAPAN
关键词
TFT-LCD; duplication redundancy; automatic defect tolerance; active matrix;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a new duplication redundancy technology, 2 Transistors for 1.5 Gates, that is capable of automatic defect tolerance, so making large, high-resolution, color TFT-LCD panel fabrication both easy and economical. This redundancy technology with automatic defect tolerant capability has a low hardware overhead and is very capable of compensating for open circuit defects in a large active-matrix panel. This technology was confirmed by fabricating a 9.5-inch color TFT-LCD panel with 640x480 pixels (960x960 dots). This panel showed excellent display performance and produced pictures without defects. The yield improvement effect of this technology was also confirmed by calculation based on the Boltzmann statistics model. Consequently, this technology is clearly seen to have a yield improvement effect equal to defect density reduction of about one order, compared to non redundancy. This technology drastically reduces dot and line defects, enabling fabrication of large, high-resolution, color TFT-LCD panels at a relatively low cost.
引用
收藏
页码:1083 / 1090
页数:8
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