Current and voltage ADC using a differential pair of single-electron bipolar avalanche transistors

被引:1
|
作者
Lany, Marc [1 ]
Popovic, Radivoje S. [1 ]
机构
[1] Ecole Polytech Fed Lausanne, CH-1015 Lausanne, Switzerland
关键词
Analog-digital conversion; Avalanche breakdown; Bipolar transistors;
D O I
10.1109/BIPOL.2009.5314129
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Single-electron bipolar avalanche transistors (SEBATs) enable current sensing by electron counting at room temperature. Here, differential SEBAT circuits combining the functions of amplification and analog-to-digital (A/D) conversion are proposed and characterized for two applications: Low-current AID conversion and differential voltage A/D conversion. Charge detection efficiencies in the order of 30% are reached, allowing for the direct A/D conversion of currents in the 10(-13) A range. An equivalent of the differential pair is used as a differential voltage ADC.
引用
收藏
页码:127 / 130
页数:4
相关论文
共 50 条
  • [1] Coupled single-electron transistors as a differential voltage amplifier
    Wu, C. S.
    Lin, C. F.
    Kuo, Watson
    Chen, C. D.
    NEW JOURNAL OF PHYSICS, 2006, 8
  • [2] Resonant Cooper-pair tunneling in voltage-biased superconducting single-electron transistors
    Siewert, J
    Schon, G
    CZECHOSLOVAK JOURNAL OF PHYSICS, 1996, 46 : 2397 - 2398
  • [3] Si single-electron transistors with high voltage gain
    Ono, Y
    Yamazaki, K
    Takahashi, Y
    IEICE TRANSACTIONS ON ELECTRONICS, 2001, E84C (08) : 1061 - 1065
  • [4] SINGLE-ELECTRON TUNNELING TRANSISTORS INCORPORATING COOPER PAIR PROCESSES
    Tuominen, M. T.
    Hergenrother, J. M.
    Tighe, T. S.
    Tinkham, M.
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1993, 3 (01) : 1972 - 1975
  • [5] Single-electron transistors
    Hadley, P
    Lientschnig, G
    Lai, MJ
    COMPOUND SEMICONDUCTORS 2002, 2003, 174 : 125 - 132
  • [6] Single-electron transistors
    Devoret, M
    Glattli, C
    PHYSICS WORLD, 1998, 11 (09) : 29 - 33
  • [7] Silicon single-electron transistors and single-electron CCD
    Takahashi, Y
    Fujiwara, A
    Ono, Y
    Inokawa, H
    MATERIALS ISSUES IN NOVEL SI-BASED TECHNOLOGY, 2002, 686 : 181 - 191
  • [8] Dynamic Driving Current Using Side Gate Bias of Single-Electron Transistors
    Lee, Joung-Eob
    Kim, Garam
    Kim, Kyung-Wan
    Lee, Jung-Han
    Kang, Kwon-Chil
    Lee, Jong-Ho
    Shin, Hyungcheol
    Park, Byung-Gook
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2011, 50 (07)
  • [9] Compact current and current noise models for single-electron tunneling transistors
    Hu, CH
    Cotofana, SD
    Jiang, JF
    2004 4TH IEEE CONFERENCE ON NANOTECHNOLOGY, 2004, : 361 - 364
  • [10] Graphene single-electron transistors
    Ihn, T.
    Guettinger, J.
    Molitor, F.
    Schnez, S.
    Schurtenberger, E.
    Jacobsen, A.
    Hellmueller, S.
    Frey, T.
    Droescher, S.
    Stampfer, C.
    Ensslin, K.
    MATERIALS TODAY, 2010, 13 (03) : 44 - 50