共 50 条
- [37] Thermal stability investigation of copper-gate AlGaN/GaN high electron mobility transistors 5TH INTERNATIONAL CONFERENCE ON NITRIDE SEMICONDUCTORS (ICNS-5), PROCEEDINGS, 2003, 0 (07): : 2376 - 2379
- [38] Reverse gate bias-induced degradation of AlGaN/GaN high electron mobility transistors JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (05): : 1044 - 1047
- [39] Effect of different gate lengths on device linearity in AlGaN/GaN high electron mobility transistors PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2020, 119 (119):