AlGaN/GaN Open-Gate High Electron Mobility Transistors for Glucose Detection

被引:1
|
作者
Liu, Jun [1 ]
Liang, Hongwei [1 ]
Xue, Dongyang [1 ]
Zhang, Heqiu [1 ]
Huang, Huishi [2 ]
Guo, Wenping [3 ]
机构
[1] Dalian Univ Technol, Sch Microelect, Dalian 116024, Peoples R China
[2] Jiangsu Xinguanglian Technol Co Ltd, Wuxi 214192, Jiangsu, Peoples R China
[3] Shandong Novoshine Co Ltd, Weifang 261000, Peoples R China
基金
美国国家科学基金会;
关键词
AlGaN/GaN; HEMT; Photo-electrochemical treatment; Glucose oxidase; APTES; Glucose; FIELD-EFFECT TRANSISTORS;
D O I
10.1117/12.2559688
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
AlGaN/GaN high electron mobility transistors (HEMTs) have more remarkable properties in application of microwave transistors for high power and high frequency. A less widely studied application is high sensitivity to detect a wide range concentration of glucose. In this work, a photo-electrochemically treated open-gate AlGaN/GaN HEMT biosensor for glucose detection was developed. Through photo-electrochemical treatment, a smooth and thin gallium oxide can be formed on the sensing region. The threshold voltage was changed from -3.3 V to -1.3 V at a swept gain voltage. And a maximum value of transconductance was obtained at the gate voltage of 0 V. Effective functionalization of 3-aminopropyltriethoxysilane (APTES) and immobilization of glucose oxidase (GOx) can be realized on the oxidized sensing region. The proposed sensor exhibited good current response to glucose concentration over a wide linear range with high sensitivity above 8.61 x 10(5) mu A/mM.cm(2). The performance of the fabricated biosensor demonstrates the possibility of using AlGaN/GaN HEMTs for high sensitivity glucose detection in biochemical application.
引用
收藏
页数:4
相关论文
共 50 条
  • [31] Botulinum toxin detection using AlGaN/GaN high electron mobility transistors
    Wang, Yu-Lin
    Chu, B. H.
    Chen, K. H.
    Chang, C. Y.
    Lele, T. P.
    Tseng, Y.
    Pearton, S. J.
    Ramage, J.
    Hooten, D.
    Dabiran, A.
    Chow, P. P.
    Ren, F.
    APPLIED PHYSICS LETTERS, 2008, 93 (26)
  • [32] Electrical detection of biomaterials using AlGaN/GaN high electron mobility transistors
    Kang, B. S.
    Wang, H. T.
    Ren, F.
    Pearton, S. J.
    JOURNAL OF APPLIED PHYSICS, 2008, 104 (03)
  • [33] Analysis of Schottky gate electron tunneling in polarization induced AlGaN/GaN high electron mobility transistors
    Sierakowski, AJ
    Eastman, LF
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (06) : 3398 - 3401
  • [34] The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors
    Besendoerfer, Sven
    Meissner, Elke
    Medjdoub, Farid
    Derluyn, Joff
    Friedrich, Jochen
    Erlbacher, Tobias
    SCIENTIFIC REPORTS, 2020, 10 (01)
  • [35] Influence of device dimension and gate recess on the characteristics of AlGaN/GaN high electron mobility transistors
    Lee, Jong-Min
    Yoon, Hyung-Sup
    Min, Byoung-Gue
    Mun, Jae-Kyoung
    Nam, Eunsoo
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2012, 54 (09) : 2103 - 2106
  • [36] Fabrication and characterization of V-gate AlGaN/GaN high-electron-mobility transistors
    张凯
    曹梦逸
    陈永和
    杨丽媛
    王冲
    马晓华
    郝跃
    Chinese Physics B, 2013, (05) : 488 - 491
  • [37] Thermal stability investigation of copper-gate AlGaN/GaN high electron mobility transistors
    Ao, JP
    Kubota, N
    Kikuta, D
    Naoi, Y
    Ohno, Y
    5TH INTERNATIONAL CONFERENCE ON NITRIDE SEMICONDUCTORS (ICNS-5), PROCEEDINGS, 2003, 0 (07): : 2376 - 2379
  • [38] Reverse gate bias-induced degradation of AlGaN/GaN high electron mobility transistors
    Chang, Chih-Yang
    Anderson, Travis
    Hite, Jennifer
    Lu, Liu
    Lo, Chien-Fong
    Chu, Byung-Hwan
    Cheney, D. J.
    Douglas, E. A.
    Gila, B. P.
    Ren, F.
    Via, G. D.
    Whiting, Patrick
    Holzworth, R.
    Jones, K. S.
    Jang, Soohwan
    Pearton, S. J.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (05): : 1044 - 1047
  • [39] Effect of different gate lengths on device linearity in AlGaN/GaN high electron mobility transistors
    Cui, Peng
    Lv, Yuanjie
    Liu, Huan
    Cheng, Aijie
    Luan, Chongbiao
    Zhou, Yang
    Lin, Zhaojun
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2020, 119 (119):
  • [40] Gate-Lag in AlGaN/GaN High Electron Mobility Transistors: A Model of Charge Capture
    Polyakov, A. Y.
    Smirnov, N. B.
    Shchemerov, I. V.
    Ren, Fan
    Pearton, S. J.
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2017, 6 (11) : S3034 - S3039