The GEO total ionizing dose

被引：10
|
作者：
Solin, JR [1 ]
机构：
[1] Lockheed Martin Missiles & Space, San Jose, CA 95150 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1998年 / 45卷 / 06期
关键词：
D O I：
10.1109/23.736553
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The standard estimates of the GEO total ionizing dose are revised to account for enhancement of the bremsstrahlung dose by high-Z layers in IC packages, IC die, and spacecraft shields.
引用
收藏
页码：2964 / 2971
页数：8
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