The GEO total ionizing dose

被引：10
|
作者：
Solin, JR [1 ]
机构：
[1] Lockheed Martin Missiles & Space, San Jose, CA 95150 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1998年 / 45卷 / 06期
关键词：
D O I：
10.1109/23.736553
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The standard estimates of the GEO total ionizing dose are revised to account for enhancement of the bremsstrahlung dose by high-Z layers in IC packages, IC die, and spacecraft shields.
引用
收藏
页码：2964 / 2971
页数：8
相关论文
共 50 条
  • [21] Total ionizing dose sensitivity of function blocks in FRAM
    Gu, Ke
    Liou, J. J.
    Li, Wei
    Liu, Yang
    Li, Ping
    MICROELECTRONICS RELIABILITY, 2015, 55 (06) : 873 - 878
  • [22] ATOMIC DISPLACEMENT AND TOTAL IONIZING DOSE DAMAGE IN SEMICONDUCTORS
    BRAUNIG, D
    WULF, F
    RADIATION PHYSICS AND CHEMISTRY, 1994, 43 (1-2) : 105 - 127
  • [23] Total Ionizing Dose Effects on Current Sense Amplifiers
    Aksteiner, N.
    Budroweit, J.
    2021 21ST EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2021, : 297 - 300
  • [24] Total Ionizing Dose Tolerance of LoRa Wireless Devices
    Armani, J. M.
    Gibrat, J. F.
    Martinez, J.
    2022 22ND EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, RADECS, 2022, : 359 - 362
  • [25] Total Ionizing Dose Effects in Piezoelectric MEMS Relays
    Proie, Robert M., Jr.
    Polcawich, Ronald G.
    Cress, Cory D.
    Sanchez, Luz M.
    Grobicki, Alden D.
    Pulskamp, Jeffrey S.
    Roche, Nicolas J-H.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2013, 60 (06) : 4505 - 4511
  • [26] Total Ionizing Dose and Dose Rate Effects in Candidate Spacecraft Electronic Devices
    Bogorad, Alexander L.
    Likar, Justin J.
    Moyer, Stephen K.
    Ditzler, Audrey J.
    Doorley, Graham P.
    Herschitz, Roman
    NSRE: 2008 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2008, : 124 - 130
  • [27] Total ionizing dose hardness assurance issues for high dose rate environments
    Schwank, J. R.
    Sexton, F. W.
    Shaneyfelt, M. R.
    Fleetwood, D. M.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (04) : 1042 - 1048
  • [28] System Health Awareness in Total-Ionizing Dose Environments
    Diggins, Zachary J.
    Mahadevan, Nagabhushan
    Pitt, E. Bryn
    Herbison, Daniel
    Karsai, Gabor
    Sierawski, Brian D.
    Barth, Eric J.
    Reed, Robert A.
    Schrimpf, Ronald D.
    Weller, Robert A.
    Alles, Michael L.
    Witulski, Arthur F.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 62 (04) : 1674 - 1681
  • [29] Total ionizing dose effects on voltage-to-frequency converters
    Lee, CI
    Johnston, AH
    Rax, BG
    1998 IEEE RADIATION EFFECTS DATA WORKSHOP, 1998, : 117 - 120
  • [30] Total Ionizing Dose Effects on Triple-Gate Fets
    Liu, Shi-Yao
    He, Wei
    Cao, Jim-Min
    Huang, Si-Wen
    Zhao, Xiao-Jin
    2012 IEEE 11TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT-2012), 2012, : 28 - 30
12345