Bit error rate analysis for flip-flop and latch based interconnect pipelining

被引:0
|
作者
Xu, Jingye [1 ]
Chowdhury, Masud H. [1 ]
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Chicago, IL 60607 USA
关键词
D O I
10.1109/ICECS.2006.379621
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As integrated circuits technology enters into interconnect-centric nanometer regime, it will be impossible to carry cross-chip signals in a single clock cycle and interconnect pipelining becomes an acceptable solution beyond traditional buffer-insertion based interconnect systems. This paper performed a detailed analysis for the bit error rate (BER) of two kinds of interconnect pipelining approaches, and find that the BER is unusually high for some cases. Here the cause of the high BER has been analyzed, and a method to deal with it is proposed. A comparative study of the two interconnect pipelining approaches is also presented in this paper, which will help exploring trade-offs between number of sequential elements inserted and the probability of bit-error during data transmission.
引用
收藏
页码:1061 / 1064
页数:4
相关论文
共 50 条
  • [31] Analysis and synthesis of a flip-flop comparator
    Krekhov, EV
    Krekhov, IV
    MEASUREMENT TECHNIQUES, 2002, 45 (11) : 1175 - 1182
  • [32] Bit Error Rate Measurements of All-Optical Flip-Flop Operations of a 1.55-μm Polarization Bistable VCSEL
    Hayashi, Daisuke
    Takahashi, Haruna
    Katayama, Takeo
    Kawaguchi, Hitoshi
    JOURNAL OF LIGHTWAVE TECHNOLOGY, 2014, 32 (15) : 2671 - 2677
  • [33] Burst error generator using flip-flop metastability
    Kulkarni, G
    Naware, V
    Govindarajan, M
    ELECTRONICS LETTERS, 1999, 35 (02) : 108 - 109
  • [34] Shift Register Design Using Two Bit Flip-Flop
    Sharma, Shefali
    Kaushal, Bipan
    2014 RECENT ADVANCES IN ENGINEERING AND COMPUTATIONAL SCIENCES (RAECS), 2014,
  • [35] Characterizing metastability and jitter in CMOS latch/flip-flop used as a digital mixer
    Shankar, I
    Morris, SA
    Hutchens, CG
    2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL III, CONFERENCE PROCEEDINGS, 2002, : 560 - 563
  • [36] Flow through latch and edge-triggered flip-flop hybrid elements
    Partovi, H
    Burd, R
    Salim, U
    Weber, F
    DiGregorio, L
    Draper, D
    1996 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE, DIGEST OF TECHNICAL PAPERS, 1996, 39 : 138 - 139
  • [37] Bit Error Rate Measurements of All-Optical Flip-Flop Operations Using a 1.55-μm Polarization Bistable VCSEL
    Hayashi, Daisuke
    Takahashi, Haruna
    Katayama, Takeo
    Kawaguchi, Hitoshi
    2014 OPTOELECTRONICS AND COMMUNICATIONS CONFERENCE AND AUSTRALIAN CONFERENCE ON OPTICAL FIBRE TECHNOLOGY (OECC/ACOFT 2014), 2014, : 33 - 34
  • [38] Latch based interconnect pipelining for high speed integrated circuits
    Xu, Jingye
    Chowdhury, Masud H.
    2006 IEEE INTERNATIONAL CONFERENCE ON ELECTRO/INFORMATION TECHNOLOGY, 2006, : 295 - 300
  • [39] Design of hardened flip-flop using Schmitt trigger-based SEM latch in CNTFET technology
    Badugu, Divya Madhuri
    Sunithamani, S.
    Shaik, Javid Basha
    Vobulapuram, Ramesh Kumar
    CIRCUIT WORLD, 2021, 47 (01) : 51 - 59
  • [40] Framework for selective flip-flop replacement for soft error mitigation
    Torvi, Pavan Vithal
    Devanathan, V. R.
    Kamakoti, V.
    2015 28TH INTERNATIONAL CONFERENCE ON VLSI DESIGN (VLSID), 2015, : 381 - 386