High-resolution, low-temperature photoemission spectroscopy of Kondo semiconductor CeRhAs and related compounds

被引：2
|
作者：
Shimada, K [1 ]
Kobayashi, K
Narimura, T
Baltzer, P
Namatame, H
Taniguchi, M
Suemitsu, T
Sasakawa, T
Takabatake, T
机构：
[1] Hiroshima Univ, Hiroshima Synchrotron Radiat Ctr, Higashihiroshima 7398526, Japan
[2] Hiroshima Univ, Grad Sch Sci, Higashihiroshima 7398526, Japan
[3] Hiroshima Univ, ADSM, Dept Quantum Matter, Higashihiroshima 7398530, Japan
来源：
PHYSICA B-CONDENSED MATTER | 2003年 / 329卷
关键词：
Kondo semiconductor; photoemission spectroscopy; CeRhAs; CeRhSb;
D O I：
10.1016/S0921-4526(02)02451-1
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Cc 4f states of the Kondo semiconductor CeRhAs, semimetal CeRhSb, and metal CePtSn single crystals were observed directly by high-resolution resonant photoemission spectroscopy. A large gap and a pseudogap were found in CeRhAs and CeRhSb, respectively. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：576 / 577
页数：2
相关论文
共 50 条
  • [31] High resolution photoemission study of low-temperature oxidation on the Si(001) surface
    Yeom, HW
    Uhrberg, R
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (7B): : 4460 - 4463
  • [32] HIGH-RESOLUTION PHOTOEMISSION SPECTROSCOPY USING SYNCHROTRON RADIATION
    EASTMAN, DE
    GROBMAN, WD
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1972, 17 (03): : 367 - &
  • [33] High-resolution photoemission spectroscopy of CeSi single crystal
    Mimura, K
    Takase, T
    Mizohata, H
    Taguchi, Y
    Ichikawa, K
    Takeda, Y
    Arita, M
    Shimada, K
    Namatame, H
    Noguchi, S
    Okuda, K
    Taniguchi, M
    Aita, O
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2001, 114 (114-116) : 723 - 727
  • [34] HIGH-RESOLUTION ISOCHROMAT INVERSE-PHOTOEMISSION SPECTROSCOPY
    SUGA, S
    MATSUSHITA, T
    SHIGEOKA, H
    KIMURA, A
    NAMATAME, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1993, 32 (12B): : L1841 - L1844
  • [35] CAPACITANCE BRIDGE FOR LOW-TEMPERATURE, HIGH-RESOLUTION DIELECTRIC MEASUREMENTS
    FOOTE, MC
    ANDERSON, AC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (01): : 130 - 132
  • [36] HIGH-RESOLUTION UHF INTERFEROMETER FOR LOW-TEMPERATURE PLASMA DIAGNOSTICS
    LISITSKAYA, AA
    SHUSTIN, EG
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1981, 24 (01) : 158 - 161
  • [37] A HIGH-RESOLUTION MEASUREMENT OF THE LOW-TEMPERATURE EMISSIVITY OF BALLINFRARED BLACK
    Tuttle, J.
    Canavan, E.
    DiPirro, M.
    Li, X.
    Franck, R.
    Green, D.
    ADVANCES IN CRYOGENIC ENGINEERING, VOLS 57A AND 57B, 2012, 1434 : 1505 - 1512
  • [38] High-resolution photoemission studies of adsorbates and overlayers on semiconductor surfaces
    Uhrberg, RIG
    Zhang, HM
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2004, 137 : 205 - 210
  • [39] HIGH-RESOLUTION TEMPERATURE-DEPENDENT PHOTOEMISSION SPECTROSCOPY OF FESI - EVIDENCE FOR LOCALIZED STATES
    CHAINANI, A
    YOKOYA, T
    MORIMOTO, T
    TAKAHASHI, T
    YOSHII, S
    KASAYA, M
    PHYSICAL REVIEW B, 1994, 50 (12): : 8915 - 8917
  • [40] LOW-TEMPERATURE SPECTROSCOPY OF BIOLOGICAL COMPOUNDS
    BRODA, E
    SCIENCE, 1948, 108 (2798) : 158 - 158
12345