A Dedicated Illumination For Full-Field X-ray Microscopy With Multilayer Laue Lenses

被引：0
|
作者：
Niese, Sven [1 ]
Braun, Stefan [2 ]
Dietsch, Reiner [1 ]
Gluch, Juergen [3 ]
Holz, Thomas [1 ]
Huber, Norman [4 ]
Kubec, Adam [2 ]
Zschech, Ehrenfried
机构：
[1] AXO DRESDEN GmbH, Gasanstaltstr 8b, D-01237 Dresden, Germany
[2] Fraunhofer Inst Mat & Beam Technol, Winterbergstr 28, D-01277 Dresden, Germany
[3] Fraunhofer Inst Ceram Technol & Syst, Maria Reiche Str 2, D-01109 Dresden, Germany
[4] HUBER Diffrakt Tech GmbH & Co KG, Sommerstr 4, D-83253 Rimsting, Germany
来源：
ICXOM23: INTERNATIONAL CONFERENCE ON X-RAY OPTICS AND MICROANALYSIS | 2016年 / 1764卷
关键词：
D O I：
10.1063/1.4961130
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a concept of a dedicated illumination to perform full-field X-ray microscopy with multilayer Laue lenses at laboratory X-ray sources. The basic idea is the application of a focusing X-ray multilayer mirror as condenser optics to provide a quasi-monochromatic and solid illumination, and consequently optimal conditions for the operation of the multilayer Laue lenses. First experimental results demonstrate the proof of this concept.
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页数：6
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