A Dedicated Illumination For Full-Field X-ray Microscopy With Multilayer Laue Lenses

被引：0

作者：

Niese, Sven ^{[1
]}

Braun, Stefan ^{[2
]}

Dietsch, Reiner ^{[1
]}

Gluch, Juergen ^{[3
]}

Holz, Thomas ^{[1
]}

Huber, Norman ^{[4
]}

Kubec, Adam ^{[2
]}

Zschech, Ehrenfried

机构：

[1] AXO DRESDEN GmbH, Gasanstaltstr 8b, D-01237 Dresden, Germany

[2] Fraunhofer Inst Mat & Beam Technol, Winterbergstr 28, D-01277 Dresden, Germany

[3] Fraunhofer Inst Ceram Technol & Syst, Maria Reiche Str 2, D-01109 Dresden, Germany

[4] HUBER Diffrakt Tech GmbH & Co KG, Sommerstr 4, D-83253 Rimsting, Germany

来源：

ICXOM23: INTERNATIONAL CONFERENCE ON X-RAY OPTICS AND MICROANALYSIS | 2016年 / 1764卷

关键词：

D O I：

10.1063/1.4961130

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a concept of a dedicated illumination to perform full-field X-ray microscopy with multilayer Laue lenses at laboratory X-ray sources. The basic idea is the application of a focusing X-ray multilayer mirror as condenser optics to provide a quasi-monochromatic and solid illumination, and consequently optimal conditions for the operation of the multilayer Laue lenses. First experimental results demonstrate the proof of this concept.

引用

页数：6

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