Machine learning algorithms for fault diagnosis in analog circuits

被引：0
|
作者：
Rajan, V [1 ]
Ying, J [1 ]
Chakrabarty, S [1 ]
Pattipati, K [1 ]
机构：
[1] Univ Connecticut, Dept Elect & Syst Engn, U157, Storrs, CT 06269 USA
来源：
1998 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN, AND CYBERNETICS, VOLS 1-5 | 1998年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, we investigate and systematically evaluate two machine learning algorithms for analog fault detection and isolation: (1) Restricted Coloumb Energy (RCE) Neural Network, and (2) Learning Vector Quantization (LVQ). The RCE and LVQ models excel at recognition and classification types of problems. In order to evaluate the efficacy of the two learning algorithms, we have developed a software tool, termed Virtual Test-Bench (VTB), which generates diagnostic information for analog circuits represented by SPICE descriptions. The RCE and LVQ models render themselves more naturally to on-line monitoring, where measurement data from various sensors is continuously available. The effectiveness of RCE and LVQ is demonstrated on illustrative example circuits.
引用
收藏
页码：1874 / 1879
页数：6
相关论文
共 50 条
  • [21] Fault modeling and diagnosis for nanometric analog circuits
    Huang, Ke
    Stratigopoulos, Haralampos-G.
    Mir, Salvador
    [J]. 2013 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2013,
  • [22] Analog Circuits Fault Diagnosis based on μSVMs
    Yang Zhiming
    Peng Yu
    Peng Xiyuan
    [J]. IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE ON TESTING AND DIAGNOSIS, 2009, : 212 - 216
  • [23] Polynomial fault diagnosis of linear analog circuits
    Garczarczyk, Zygmunt A.
    [J]. 2007 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN, VOLS 1-3, 2007, : 842 - 845
  • [24] A Dictionary Approach to Fault Diagnosis of Analog Circuits
    Marin, Constantin Viorel
    Constantinescu, Florin
    Nitescu, Miruna
    [J]. IEEE AFRICON 2011, 2011,
  • [25] The Analysis of Analog Circuits Fault Diagnosis Methods
    Zhang, Zhiqiang
    Zhang, Aihua
    [J]. PROCEEDINGS OF THE 6TH INTERNATIONAL CONFERENCE ON ELECTRONIC, MECHANICAL, INFORMATION AND MANAGEMENT SOCIETY (EMIM), 2016, 40 : 849 - 853
  • [26] Robust Fault Diagnosis of Analog Circuits with Tolerances
    Ying Deng Yigang He Xu He Yichuang Sun College of Electrical and Information EngineeringHunan University Changsha Hunan China Department of Computer Science Hunan University Changsha Hunan China Department of Ele
    [J]. 湖南大学学报(自然科学版), 2000, (自然科学版) : 133 - 138
  • [27] Fused method of fault diagnosis for analog circuits
    Tan, Yanghong
    He, Yigang
    [J]. DYNAMICS OF CONTINUOUS DISCRETE AND IMPULSIVE SYSTEMS-SERIES B-APPLICATIONS & ALGORITHMS, 2007, 14 : 919 - 924
  • [28] Fault-trajectory approach for fault diagnosis on analog circuits
    Savioli, CE
    Czendrodi, CC
    Calvano, JV
    de Mesquita, AC
    [J]. DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, 2005, : 174 - 175
  • [29] An efficient method for faults diagnosis in analog circuits based on machine learning classifiers
    Arabi, Abderrazak
    Ayad, Mouloud
    Bourouba, Nacerdine
    Benziane, Mourad
    Griche, Issam
    Ghoneim, Sherif S. M.
    Ali, Enas
    Elsisi, Mahmoud
    Ghaly, Ramy N. R.
    [J]. ALEXANDRIA ENGINEERING JOURNAL, 2023, 77 : 109 - 125
  • [30] Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine
    Zhou, Jingyu
    Tian, Shulin
    Yang, Chenglin
    Ren, Xuelong
    [J]. COMPUTATIONAL INTELLIGENCE AND NEUROSCIENCE, 2014, 2014
12345