Initialization of sequential circuits and its application to ATPG

被引：2

作者：

Wehbeh, JA ^{[1
]}

Saab, DG

机构：

[1] Silicon Graph Inc, Mountain View, CA 94043 USA

[2] Case Western Reserve Univ, Dept ESCES, Cleveland, OH 44118 USA

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 1998年 / 13卷 / 03期

基金：

美国国家科学基金会;

关键词：

initialization; ATPG; verification; CAD;

D O I：

10.1023/A:1008333803059

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A general method for determining whether a certain design is initializable, and for generating its initialization sequence, is presented in this paper. This method is based on structural decomposition of the circuit, and can handle both logical (using X-value simulation) and functional initializability. The routines developed are then used for ATPG of sequential circuits. A "pre-test" sequence that initializes the good and as many of the faulty machines as possible is generated and used in conjunction with CRIS [5], a simulation based sequential ATPG program, to generate a test set for the circuit.

引用

页码：259 / 271

页数：13

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