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- [3] STRUCTURE AND TECHNIQUE FOR PSEUDORANDOM-BASED TESTING OF SEQUENTIAL-CIRCUITS [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1995, 6 (01): : 107 - 115
- [6] A TEST-GENERATION PROGRAM FOR SEQUENTIAL-CIRCUITS [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1994, 5 (01): : 115 - 119
- [7] TEST-GENERATION FOR HIGHLY SEQUENTIAL-CIRCUITS [J]. 1989 IEEE INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN: DIGEST OF TECHNICAL PAPERS, 1989, : 362 - 365
- [8] FAST TEST-GENERATION FOR SEQUENTIAL-CIRCUITS [J]. 1989 IEEE INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN: DIGEST OF TECHNICAL PAPERS, 1989, : 354 - 357
- [9] TEST-GENERATION FOR PRESETTABLE SYNCHRONOUS SEQUENTIAL-CIRCUITS [J]. 1989 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONS: PROCEEDINGS OF TECHNICAL PAPERS, 1989, : 155 - 158
- [10] AN ALGEBRAIC TEST-GENERATION PROCEDURE FOR SEQUENTIAL-CIRCUITS [J]. ALTA FREQUENZA, 1984, 53 (03): : 126 - 142