Term trees in application to an effective and efficient ATPG for AND-EXOR and AND-OR circuits

被引:3
|
作者
Józwiak, L
Slusarczyk, A
Perkowski, M
机构
[1] Eindhoven Univ Technol, Fac Elect Engn, NL-5600 MB Eindhoven, Netherlands
[2] Portland State Univ, Dept Elect & Comp Engn, Portland, OR 97207 USA
关键词
decision diagrams; term trees; circuit structure representation; automatic test-pattern generation; structural fault model;
D O I
10.1080/10655140290009837
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A compact data representation, in which the typically required operations are performed rapidly, and effective and efficient algorithms that work on these representations are the essential elements of a successful CAD tool. The objective of this paper is to present a new data representation-term trees (TTs)-and to discuss its application for an effective and efficient structural automatic test-pattern generation (ATPG). Term trees are decision diagrams similar to BDDs that are particularly suitable for structure representation of AND-OR and AND-EXOR circuits. In the paper, a flexible algorithm for minimum term-tree construction is discussed and an effective and efficient algorithm for ATPG for AND-EXOR and AND-OR circuits is proposed. The term trees can be used for many other purposes in logic design and in other areas-for all purposes where compact representation and efficient manipulation of term sets is important. The presented experimental results show that term trees are indeed a compact data representation allowing fast manipulations. They form a good base for algorithms considering the function's and circuit's term structures.
引用
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页码:107 / 122
页数:16
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