Emission characteristics of the molybdenum-coated silicon field emitter array

被引:4
|
作者
Park, HW [1 ]
Ju, BK [1 ]
Lee, YH [1 ]
Park, JH [1 ]
Oh, MH [1 ]
机构
[1] KOREA UNIV, DEPT ELECT ENGN, SEONGBUK KU, SEOUL 136701, SOUTH KOREA
关键词
tip; reactive ion etching; sharpening; current fluctuation; Fowler-Nordheim;
D O I
10.1143/JJAP.35.L1301
中图分类号
O59 [应用物理学];
学科分类号
摘要
Uniform and reproducible silicon tip arrays were fabricated using the reactive ion etching followed by the reoxidation sharpening. Molybdenum was coated on the some of the silicon tip array. Current-voltage characteristics and current fluctuations were tested in the high vacuum level. Turn-on voltage of the uncoated tip was 35 V and maximum current was 1 mA, while turn-on voltage of the coated tip was 15 V and maximum current was 6 mA. While uncoated silicon tip was destroyed after 13 minutes after operation and showed rapid lowering of emission current, coated tip showed stable emission characteristics. Obtained currents were proved to be field emission currents using the Fowler-Nordheim plot studies.
引用
收藏
页码:L1301 / L1304
页数:4
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