Gate Drive Investigations of IGBT Modules with SiC-Schottky Freewheeling Diodes

被引:0
|
作者
Ren, Na [1 ]
Sheng, Kuang [1 ]
Zhang, Junming [1 ]
Peng, Fangzheng [2 ]
机构
[1] Zhejiang Univ, Coll Elect Engn, Hangzhou 310003, Zhejiang, Peoples R China
[2] Michigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA
关键词
CIRCUIT;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
In this paper, a current source driver is presented for IGBT modules. For conventional voltage source gate driver, the influence of the gate drive resistance on switching performances is investigated for IGBT modules with SiC-Schottky freewheeling diodes. The influence on turn-off switching losses is marginal while a reduction by a factor of 3 can be achieved for turn-on switching losses when the gate drive resistance reduced from 40 Omega to 10 Omega. The current source driver can achieve a turn-on loss reduction by a factor of 14 when compared to the conventional gate driver with 40 Omega gate drive resistance, without a large I-rr due to the SiC-Schottky freewheeling diode. Experimental results are presented to show the IGBT switching performance with this proposed fast gate driver.
引用
收藏
页码:2871 / 2876
页数:6
相关论文
共 44 条
  • [31] Influence of the gate material and temperature on the diode properties of Schottky diodes based on SiC in O2 or CO ambient
    Nakagomi, S
    Sanada, Y
    Shinobu, H
    Unéus, L
    Lundström, I
    Ekedahl, LG
    Spetz, AL
    TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2001, : 1758 - 1761
  • [32] Investigation of Gate Current Shaping for SiC-based Power Modules on Electrical Drive System Power Losses
    Sayed, Mohamad
    Araujo, Samuel
    Carraro, Federico
    Kennel, Ralph
    2021 23RD EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'21 ECCE EUROPE), 2021,
  • [33] New communication and isolation technology for integrated gate driver IC solutions suitable for IGBT and Si/SiC MOSFETs Gate Drive Units, Intelligent Integrated Drivers
    Smith, Andrew
    Lenz, Kevin
    THIRTY-THIRD ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2018), 2018, : 2986 - 2991
  • [34] Comparison of SiC MOSFET gate-drive concepts to suppress parasitic turn-on in low inductance power modules
    Maerz, Andreas
    Bertelshofer, Teresa
    Helsper, Martin
    Bakran, Mark-M.
    2017 19TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'17 ECCE EUROPE), 2017,
  • [35] Unsymmetrical Gate Voltage Drive for High Power 1200V IGBT4 Modules Based on Coreless Transformer Technology Driver
    Luniewski, Piotr
    Jansen, Uwe
    2008 13TH INTERNATIONAL POWER ELECTRONICS AND MOTION CONTROL CONFERENCE, VOLS 1-5, 2008, : 88 - 96
  • [36] Experimental Comparison of High-Speed Gate Driver Design for 1.2-kV/120-A Si IGBT and SiC MOSFET Modules
    Yin, Shan
    Tseng, King Jet
    Simanjorang, Rejeki
    Tu, Pengfei
    IET POWER ELECTRONICS, 2017, 10 (09) : 979 - 986
  • [37] Gate Drive Technology Evaluation and Development to Maximize Switching Speed of SiC Discrete Devices and Power Modules in Hard Switching Applications
    Gui, Handong
    Zhang, Zheyu
    Chen, Ruirui
    Niu, Jiahao
    Tolbert, Leon M.
    Wang, Fei
    Costinett, Daniel
    Blalock, Benjamin J.
    Choi, Benjamin B.
    IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2020, 8 (04) : 4160 - 4172
  • [38] Event-Triggered Gate Drive for a 1.7 kV Si-SiC Hybrid Switch with IGBT-like Short-Circuit Robustness
    Kayser, Felix
    Eckel, Hans-Guenter
    2023 25TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS, EPE'23 ECCE EUROPE, 2023,
  • [39] A Dynamic Wireless Charging System for Electric Vehicles Based on DC/AC Converters with SiC MOSFET-IGBT Switches and Resonant Gate-Drive
    Rosu, S. G.
    Khalilian, M.
    Cirimele, V.
    Guglielmi, P.
    PROCEEDINGS OF THE IECON 2016 - 42ND ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, 2016, : 4459 - 4464
  • [40] 600 V 4H-SiC MOSFETs Fabricated in Commercial Foundry With Reduced Gate Oxide Thickness of 27 nm to Achieve IGBT-Compatible Gate Drive of 15 V
    Agarwal, Aditi
    Han, Kijeong
    Baliga, B. Jayant
    IEEE ELECTRON DEVICE LETTERS, 2019, 40 (11) : 1792 - 1795