High-accuracy architecture-level power estimation for partitioned SRAM arrays in a 65-nm CMOS BPTM process

In this paper we validate our previously proposed high-level power estimation models for a 65-nm BPTM process, using a physically partitioned 2-kB 6T-SRAM array. Also, we describe a new probing methodology that allows us to accurately capture not only subthreshold leakage, but also all other significant leakage mechanisms. By combining the probing methodology and the power models, we can estimate dynamic, leakage and total power of the partitioned 2-kB memory array with a 97% accuracy of that of full circuit-level simulations of the entire array. We also discuss the effect of partitioning on SRAM array power with respect to process technology scaling: Partitioning has the effect that leakage-power constitutes an increasing fraction of total memory-power emphasizing the need to accurately capture leakage power in SRAM power models.