Referenceless single-loop CDR with a half-rate linear PD and frequency acquisition technique

被引:1
|
作者
Kim, H. R. [1 ,2 ]
Chun, J. -H. [2 ]
机构
[1] Samsung Elect Co Ltd, Memory Div, Hwaseong, South Korea
[2] Sungkyunkwan Univ, Coll Informat & Commun Engn, 2066 Seobu Ro, Suwon, Gyeonggi Do, South Korea
关键词
phase detectors; CMOS integrated circuits; clock and data recovery circuits; jitter; referenceless single-loop CDR; half-rate linear PD; referenceless single-loop clock; clock and data recovery circuit; half-rate linear phase detector; frequency-tracking unit; cycle-slip detector; high frequency jitter tolerance; phase-tracking loop; frequency acquisition technique; power; 26; 0; mW; voltage; 1; V; GB/S; TRANSCEIVER;
D O I
10.1049/el.2019.3075
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A referenceless single-loop clock and data recovery (CDR) circuit with a half-rate linear phase detector (PD) and an inherent frequency acquisition technique are introduced. Cycle-slip in the half-rate linear PD and its relationship with the frequency acquisition are described in detail. The single-loop CDR consists of a conventional phase-tracking loop and a frequency-tracking unit, referred to as the cycle-slip detector. The proposed CDR is fabricated in a 28 nm CMOS process and achieves a wide capture range of 2.6 Gb/s for a PRBS31 pattern. The RMS and peak-to-peak jitter of the recovered clock are 2.40ps(rms) and 21.4ps(pp), respectively, at 8 Gb/s. The high frequency jitter tolerance is measured as 0.3UI(pp). The CDR occupies 0.105mm(2) and consumes 26 mW at 8 Gb/s from a 1.0 V supply.
引用
收藏
页码:237 / +
页数:3
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