Characterization of an LVDS Link in 28 nm CMOS for Multi-Purpose Pattern Recognition

被引：1
|
作者：
Traversi, Gianluca [1 ,2 ]
De Canio, Francesco [1 ,2 ]
Liberali, Valentino [3 ,4 ]
Stabile, Alberto [3 ,4 ]
机构：
[1] Univ Bergamo, Bergamo, Italy
[2] INFN Pavia, Pavia, Italy
[3] Univ Milan, Milan, Italy
[4] INFN Milano, Milan, Italy
来源：
2018 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2018年
关键词：
D O I：
10.1109/ISCAS.2018.8351576
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents the characterization of an input/output interface circuit designed for multi-purpose pattern recognition applications compatible with low-voltage fully differential signaling (LVDS) standard. The driver and receiver circuits described in this work has been designed and fabricated in a 28 nm CMOS technology. The prototype chip has been mounted on a printed circuit board with physical characteristics similar to the real application case and fully validated up to 1 Gb/s with input random patterns.
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页数：4
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