A statistical model for path delay faults in VLSI circuits

被引：1
|
作者：
Hamad, M [1 ]
Landis, D [1 ]
机构：
[1] UNIV S FLORIDA,COLL ENGN,TAMPA,FL 33620
来源：
PROCEEDINGS OF THE IEEE SOUTHEASTCON '96: BRINGING TOGETHER EDUCATION, SCIENCE AND TECHNOLOGY | 1996年
关键词：
D O I：
10.1109/SECON.1996.510096
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
引用
收藏
页码：388 / 392
页数：3
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