Direct measurement of standard cells with a Josephson junction array voltage standard

被引：0

作者：

Katkov, A ^{[1
]}

Niemeyer, J ^{[1
]}

Behr, R ^{[1
]}

机构：

[1] DI Mendeleyev Inst Metrol, St Petersburg 198005, Russia

来源：

1998 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST | 1998年

关键词：

D O I：

10.1109/CPEM.1998.700051

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The dynamic parameters of standard cells in a circuit for the direct measurement of a standard cell with a Josephson junction array voltage standard were analysed. The parameters of the models of a null-detector and a standard cell were experimentally determined. It was found that it is possible to directly measure a standard cell with a voltage standard, with an uncertainty of about 0,001 ppm.

引用

页码：552 / 553

页数：2

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