Direct measurement of standard cells with a Josephson junction array voltage standard

被引：0
|
作者：
Katkov, A [1 ]
Niemeyer, J [1 ]
Behr, R [1 ]
机构：
[1] DI Mendeleyev Inst Metrol, St Petersburg 198005, Russia
来源：
1998 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST | 1998年
关键词：
D O I：
10.1109/CPEM.1998.700051
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The dynamic parameters of standard cells in a circuit for the direct measurement of a standard cell with a Josephson junction array voltage standard were analysed. The parameters of the models of a null-detector and a standard cell were experimentally determined. It was found that it is possible to directly measure a standard cell with a voltage standard, with an uncertainty of about 0,001 ppm.
引用
收藏
页码：552 / 553
页数：2
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