ANALYSIS OF IN-PLANE STRUCTURES OF THE As-DEPOSITED Si SURFACES USING GRAZING-ANGLE X-RAY STANDING WAVES.

被引：0
|
作者：
Sakata, O. [1 ]
Kumano, S. [1 ]
Matsuki, N. [1 ]
Tanaka, Y. [1 ]
Nikolaenko, A. M. [1 ]
Hashizume, H. [1 ]
机构：
[1] Tokyo Inst Technol, Midori Ku, Yokohama, Kanagawa 226, Japan
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1996年 / 52卷
关键词：
D O I：
10.1107/S0108767396081111
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
PS12.01.09
引用
收藏
页码：C460 / C460
页数：1
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