ANALYSIS OF IN-PLANE STRUCTURES OF THE As-DEPOSITED Si SURFACES USING GRAZING-ANGLE X-RAY STANDING WAVES.

被引：0

作者：

Sakata, O. ^{[1
]}

Kumano, S. ^{[1
]}

Matsuki, N. ^{[1
]}

Tanaka, Y. ^{[1
]}

Nikolaenko, A. M. ^{[1
]}

Hashizume, H. ^{[1
]}

机构：

[1] Tokyo Inst Technol, Midori Ku, Yokohama, Kanagawa 226, Japan

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1996年 / 52卷

关键词：

D O I：

10.1107/S0108767396081111

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

PS12.01.09

引用

页码：C460 / C460

页数：1

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