ANALYSIS OF IN-PLANE STRUCTURES OF THE As-DEPOSITED Si SURFACES USING GRAZING-ANGLE X-RAY STANDING WAVES.

被引：0
|
作者：
Sakata, O. [1 ]
Kumano, S. [1 ]
Matsuki, N. [1 ]
Tanaka, Y. [1 ]
Nikolaenko, A. M. [1 ]
Hashizume, H. [1 ]
机构：
[1] Tokyo Inst Technol, Midori Ku, Yokohama, Kanagawa 226, Japan
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1996年 / 52卷
关键词：
D O I：
10.1107/S0108767396081111
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
PS12.01.09
引用
收藏
页码：C460 / C460
页数：1
相关论文
共 50 条
  • [1] GRAZING-ANGLE X-RAY STANDING WAVES
    JACH, T
    BEDZYK, MJ
    PHYSICAL REVIEW B, 1990, 42 (08): : 5399 - 5402
  • [2] In-plane structure of an arsenic-adsorbed Si(001) surface probed with grazing-angle x-ray standing waves
    Sakata, O
    Matsuki, N
    Hashizume, H
    PHYSICAL REVIEW B, 1999, 60 (23): : 15546 - 15549
  • [3] Application of grazing-angle X-ray standing waves to the in-plane structure of a 100 angstroms-thick epilayer film
    Sakata, O.
    Hashizume, H.
    Acta Crystallographica, Section A: Foundations of Crystallography, 1997, 53 (pt 6):
  • [4] Application of grazing-angle X-ray standing waves to the in-plane structure of a 100 angstrom-thick epilayer film
    Sakata, O
    Hashizume, H
    ACTA CRYSTALLOGRAPHICA SECTION A, 1997, 53 : 781 - 788
  • [5] PROPERTIES OF GRAZING-ANGLE X-RAY STANDING WAVES AND THEIR APPLICATION TO AN ARSENIC-DEPOSITED SI(111) 1X1 SURFACE
    SAKATA, O
    HASHIZUME, H
    ACTA CRYSTALLOGRAPHICA SECTION A, 1995, 51 : 375 - 384
  • [6] INPLANE STRUCTURE OF ARSENIC DEPOSITED ON THE SI(111) SURFACE STUDIED WITH THE GRAZING-ANGLE X-RAY STANDING-WAVE METHOD
    SAKATA, O
    HASHIZUME, H
    KURASHINA, H
    PHYSICAL REVIEW B, 1993, 48 (15): : 11408 - 11411
  • [7] INTERFACE STRUCTURE OF GaSe / Si(111) STUDIED BY X-RAY STANDING WAVES.
    Capelle, B.
    Petroff, J. E.
    Boulliard, J. C.
    Koebel, A.
    Zheng, Y.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C475 - C475
  • [8] CHEMICALLY DEPOSITED NI ON SI(111) INVESTIGATED WITH X-RAY STANDING WAVES
    THUNDAT, T
    ZEGENHAGEN, J
    GIBSON, WM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 1484 - 1485
  • [9] Characterizing surfaces and interfaces using X-ray standing waves
    Wang, J
    CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 1998, 3 (03) : 312 - 320
  • [10] Fourier reconstruction of adsorbate crystallographic distributions using X-ray standing waves.
    Cheng, LW
    Bedzyk, MJ
    Sturchio, NC
    Fenter, P
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 226 : U599 - U599
12345