Templates: A test generation procedure for synchronous sequential circuits

被引：0
|
作者：
Pomeranz, I
Reddy, SM
机构：
来源：
SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS | 1997年
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D O I：
暂无
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
We develop the basic definitions and procedures for a test generation concept referred to as templates that magnifies the effectiveness of test generation by taking advantage of the fact that many faults have ''similar'' test sequences. Once a template is generated, several test sequences to detect different faults are derived from it at a reduced complexity compared to the complexity of test generation.
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页码：74 / 79
页数：6
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