共 50 条
- [31] Combined mask and illumination scheme optimization for robust contact patterning on 45nm technology node flash memory devices OPTICAL MICROLITHOGRAPHY XXI, PTS 1-3, 2008, 6924 : B9243 - B9243
- [32] Patterning 45nm Flash/DRAM contact hole mask with hyper-NA immersion lithography and optimized illumination OPTICAL MICROLITHOGRAPHY XIX, PTS 1-3, 2006, 6154 : U1050 - U1062
- [33] New Electron Beam Proximity effects Correction (EBPC) approach for 45nm and 32nm nodes Manakli, S. (serdar.manakli@st.com), IEEE Electron Device Society; Japan Society of Applied Physics (IEEE Computer Society):
- [34] Compensation of high-NA mask topography effects by using object modified Kirchhoff model for 65 and 45nm nodes OPTICAL MICROLITHOGRAPHY XIX, PTS 1-3, 2006, 6154 : U613 - U622
- [35] The study of mask structure for 45nm node based on manufacturability and lithographic performance - art. no. 66071U PHOTOMASK AND NEXT-GENERATION LITHOGRAPHY MASK TECHNOLOGY XIV, PTS 1 AND 2, 2007, 6607 : U6071 - U6071
- [36] A new 45nm RFSOI Technology Optimized for Low Power, High Performance mmWave Applications 2024 19TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE, EUMIC 2024, 2024, : 102 - 105
- [37] A SPICE-compatible Model for Intel®'s 45nm High-K MOSFET WORLD CONGRESS ON ENGINEERING AND COMPUTER SCIENCE, WCECS 2011, VOL II, 2011, : 762 - 765
- [38] A 4.2GS/s 4-bit ADC in 45nm CMOS Technology 2013 IEEE ASIA PACIFIC CONFERENCE ON POSTGRADUATE RESEARCH IN MICROELECTRONICS & ELECTRONICS (PRIMEASIA), 2013, : 24 - 28
- [39] A new self-aligned nitride MTP cell with 45nm CMOS fully compatible process 2007 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2, 2007, : 91 - +
- [40] A 5Gb/s F-band ASK Transmitter in 45nm LP CMOS 2013 8TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC), 2013, : 296 - 299