Towards 100 nm Resolution X-Ray Tomography

被引：2
|
作者：
Bruyndonckx, P.
Sasov, A.
Pauwels, B.
Liu, X.
机构：
来源：
2009 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-5 | 2009年
关键词：
D O I：
10.1109/NSSMIC.2009.5402349
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Using a nano-focus x-ray source we have been able to visualize structures down to 150 nm in x-ray projection images. Because of their unlimited depth of focus, these sources don't restrict the specimen size in case of 3D tomographic imaging. Simulation studies have shown that optimization of the detector response curve and switching from a reflective x-ray target to a transmission target might allow us to reach sub-100 nm resolutions.
引用
收藏
页码：1335 / 1338
页数：4
相关论文
共 50 条
  • [31] Evolution of the nanomorphology of photovoltaic polyfluorene blends: sub-100 nm resolution with x-ray spectromicroscopy
    McNeill, C. R.
    Watts, B.
    Swaraj, S.
    Ade, H.
    Thomsen, L.
    Belcher, W.
    Dastoor, P. C.
    NANOTECHNOLOGY, 2008, 19 (42)
  • [32] High-performance 4-nm-resolution X-ray tomography using burst ptychography
    Aidukas, Tomas
    Phillips, Nicholas W.
    Diaz, Ana
    Poghosyan, Emiliya
    Muller, Elisabeth
    Levi, A. F. J.
    Aeppli, Gabriel
    Guizar-Sicairos, Manuel
    Holler, Mirko
    NATURE, 2024, 632 (8023) : 81 - +
  • [33] X-RAY OPTICS Improved Laue lenses enable x-ray microscopy with 10 nm resolution
    Wallace, John
    LASER FOCUS WORLD, 2018, 54 (01): : 21 - 22
  • [34] Coherent x-ray magnetic imaging with 5 nm resolution
    Battistelli, Riccardo
    Metternich, Daniel
    Schneider, Michael
    Kern, Lisa-Marie
    Litzius, Kai
    Fuchs, Josefin
    Klose, Christopher
    Gerlinger, Kathinka
    Bagschik, Kai
    Guenther, Christian M.
    Engel, Dieter
    Ropers, Claus
    Eisebitt, Stefan
    Pfau, Bastian
    Buettner, Felix
    Zayko, Sergey
    OPTICA, 2024, 11 (02): : 234 - 237
  • [35] Scanning soft X-ray imaging at 10 nm resolution
    Burge, RE
    Yuan, XC
    Knauer, JN
    Browne, MT
    Charalambous, P
    ULTRAMICROSCOPY, 1997, 69 (04) : 259 - 278
  • [36] Hard x-ray microscopy with a 130 nm spatial resolution
    Youn, HS
    Baik, SY
    Chang, CH
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (02): : 023702 - 1
  • [37] Soft X-ray holographic microscopy with 300 nm resolution
    Chen, J
    Gao, H
    Jiang, S
    Xie, H
    Xu, Z
    JOURNAL DE PHYSIQUE IV, 2003, 104 : 587 - 590
  • [38] Scanning x-ray diffraction with 200 nm spatial resolution
    Hanke, M.
    Dubslaff, M.
    Schmidbauer, M.
    Boeck, T.
    Schoeder, S.
    Burghammer, M.
    Riekel, C.
    Patommel, J.
    Schroer, C. G.
    APPLIED PHYSICS LETTERS, 2008, 92 (19)
  • [39] X-Ray Induced Chemical Reaction Revealed by In Situ X-Ray Diffraction and Scanning X-Ray Microscopy in 15 nm Resolution
    Ge, Mingyuan
    Liu, Wenjun
    Bock, David C.
    De Andrade, Vincent
    Yan, Hanfei
    Huang, Xiaojing
    Takeuchi, Kenneth J.
    Marschilok, Amy C.
    Takeuchi, Esther S.
    Xin, Huolin
    Chu, Yong S.
    JOURNAL OF ELECTROCHEMICAL ENERGY CONVERSION AND STORAGE, 2022, 19 (04)
  • [40] In(Ga)As/GaAs(001) quantum dot molecules probed by nanofocus high resolution x-ray diffraction with 100 nm resolution
    Dubslaff, M.
    Hanke, M.
    Burghammer, M.
    Schoeder, S.
    Hoppe, R.
    Schroer, C. G.
    Mazur, Yu. I.
    Wang, Zh. M.
    Lee, J. H.
    Salamo, G. J.
    APPLIED PHYSICS LETTERS, 2011, 98 (21)
12345