Enhanced TED: A new data structure for RTL verification

被引:1
|
作者
Lotfi-Kamran, P. [1 ]
Massoumi, M. [1 ]
Mirzaei, M. [2 ]
Navabi, Z. [1 ]
机构
[1] Univ Tehran, Sch Elect & Comp Engn, Tehran 14174, Iran
[2] Sharif Univ Technol, Sch Elect Engn, Tehran, Iran
关键词
D O I
10.1109/VLSI.2008.108
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This work provides a canonical representation for manipulation of RTL designs. Work has already been done on a canonical and graph-based representation called Taylor Expansion Diagram (TED). Although TED can effectively be used to represent arithmetic expressions at the word-level, it is not memory efficient in representing bit-level logic expressions. In addition, TED cannot represent Boolean expressions at the word-level (vector-level). In this paper, we present modifications to TED that will improve its ability for bit-level logic representation while enhancing its robustness to represent word-level Boolean expressions. It will be shown that for bit-level logic expressions, the Enhanced TED (ETED) performs the same as the BDD representation.
引用
收藏
页码:481 / +
页数:2
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