Component selection for a compact micro-XRF spectrometer

被引:37
|
作者
Bichlmeier, S
Janssens, K
Heckel, J
Gibson, D
Hoffmann, P
Ortner, HM
机构
[1] Univ Instelling Antwerp, Dept Chem, B-2610 Antwerp, Belgium
[2] Spectro Analyt Instruments GMBH & Co KG, D-47533 Kleve, Germany
[3] Tech Univ Darmstadt, D-64287 Darmstadt, Germany
[4] Xray Opt Syst, Albany, NY 12203 USA
关键词
Semiconductor diodes - X ray spectrometers - X ray tubes;
D O I
10.1002/xrs.457
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The performances of a number of commercially available components which together can be employed to assemble a compact micro-XRF spectrometer were compared. The purpose of such a spectrometer is to permit local, non-destructive analysis of various materials; its compact nature will allow it to be used on-site, i.e. at the location where the investigated objects/materials are present rather than in a laboratory. The performances of two polycapillary lenses (of different manufacture) and one monocapillary tube were compared in combination with a mini-focus x-ray tube with Mo anode. The use of an Si-drift chamber and an Si PIN-diode detector was investigated and the achievable minimum detection limits for trace elements in glass and silver matrices were determined. Finally, the effect of using mini-focus tubes (with 250 mum focus) as opposed to the use of a more conventional x-ray source (1 mm focus) on the obtained beam size was investigated. Copyright (C) 2001 John Wiley & Sons, Ltd.
引用
收藏
页码:8 / 14
页数:7
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