Characterization of heterophase transformation interfaces by high-resolution transmission electron microscope techniques

被引：0
|
作者：
Howe, JM [1 ]
机构：
[1] Univ Virginia, Dept Mat Sci & Engn, Charlottesville, VA 22903 USA
来源：
IMPACT OF ELECTRON AND SCANNING PROBE MICROSCOPY ON MATERIALS RESEARCH | 1999年 / 364卷
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D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
paper describes the application of several high-resolution transmission electron microscope (HRTEM) techniques to determine the structure, composition and dynamics of heterophase transformation interfaces at the atomic level. Emphasis is placed on the use of: 1) HRTEM to determine the atomic structure of heterophase interfaces, 2) energy-filtering TEM (EFTEM) to determine the composition at heterophase interfaces, and 3) in situ HRTEM to determine the atomic mechanisms and dynamics of interface motion. The importance of image simulation in the analysis of experimental HRTEM images and many practical aspects concerning specimen and microscope conditions during imaging are discussed.
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页码：63 / 108
页数：46
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