HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF INTERFACES

被引：3
|
作者：
DOUIN, J
EPICIER, T
PENISSON, JM
THOREL, A
机构：
[1] INST NATL SCI APPL,CTR ETUDES & CARACTERISAT MICROSTRUCT,GEMPPM,CNRS,UA 341,F-69621 VILLEURBANNE,FRANCE
[2] CEN,DEPT RECH FONDAMENTALE,SERV PHYS,F-38041 GRENOBLE,FRANCE
[3] ECOLE MINES PARIS,CTR MAT,F-91003 EVRY,FRANCE
来源：
MATERIALS CHEMISTRY AND PHYSICS | 1992年 / 32卷 / 01期
关键词：
D O I：
10.1016/0254-0584(92)90251-3
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The study of interfaces by means of High Resolution Transmission Electron Microscopy (HRTEM) is discussed through selected observations conducted on the Atomic Resolution Microscope (NCEM, Berkeley, USA). The precipitation of germanium into aluminium, the study of interfacial non-crystalline films in silicon nitride, the determination of the chemical nature of twin planes in CuAlO2, and the structure of the SIGMA-3 grain-boundary in aluminium are the examples that serve to illustrate the important problems of relevance in the atomistic study of interface with HRTEM.
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页码：77 / 85
页数：9
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