Characterization of heterophase transformation interfaces by high-resolution transmission electron microscope techniques

被引：0
|
作者：
Howe, JM [1 ]
机构：
[1] Univ Virginia, Dept Mat Sci & Engn, Charlottesville, VA 22903 USA
来源：
IMPACT OF ELECTRON AND SCANNING PROBE MICROSCOPY ON MATERIALS RESEARCH | 1999年 / 364卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
paper describes the application of several high-resolution transmission electron microscope (HRTEM) techniques to determine the structure, composition and dynamics of heterophase transformation interfaces at the atomic level. Emphasis is placed on the use of: 1) HRTEM to determine the atomic structure of heterophase interfaces, 2) energy-filtering TEM (EFTEM) to determine the composition at heterophase interfaces, and 3) in situ HRTEM to determine the atomic mechanisms and dynamics of interface motion. The importance of image simulation in the analysis of experimental HRTEM images and many practical aspects concerning specimen and microscope conditions during imaging are discussed.
引用
收藏
页码：63 / 108
页数：46
相关论文
共 50 条
  • [31] HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPE AT JOHNS HOPKINS
    WIGGINS, JW
    ZUBIN, JA
    BEER, M
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (04): : 403 - 410
  • [32] Metal-ceramic interfaces studied with high-resolution transmission electron microscopy
    De Hosson, JTM
    Goren, HB
    Kooi, BJ
    Vitek, V
    [J]. ACTA MATERIALIA, 1999, 47 (15-16) : 4077 - 4092
  • [33] Advanced techniques in automated high-resolution scanning transmission electron microscopy
    Pattison, Alexander J.
    Pedroso, Cassio C. S.
    Cohen, Bruce E.
    Ondry, Justin C.
    Alivisatos, A. Paul
    Theis, Wolfgang
    Ercius, Peter
    [J]. NANOTECHNOLOGY, 2024, 35 (01)
  • [34] AUTOMATIC-CONTROL OF A TRANSMISSION ELECTRON-MICROSCOPE FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KOSTER, AJ
    DERUIJTER, WJ
    [J]. EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 83 - 84
  • [35] AUTOMATIC-CONTROL OF A TRANSMISSION ELECTRON-MICROSCOPE FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KOSTER, AJ
    DERUIJTER, WJ
    [J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 83 - 84
  • [36] AN ULTRA HIGH-RESOLUTION ELECTRON-MICROSCOPE
    RUSCICA, RJ
    MCCARTHY, MP
    [J]. AMERICAN LABORATORY, 1980, 12 (04) : 61 - &
  • [37] High-Resolution Scanning Transmission Electron Microscopy (HRSTEM) Techniques: High-Resolution Imaging and Spectroscopy Side by Side
    Stroppa, Daniel G.
    Zagonel, Luiz F.
    Montoro, Luciano A.
    Leite, Edson R.
    Ramirez, Antonio J.
    [J]. CHEMPHYSCHEM, 2012, 13 (02) : 437 - 443
  • [38] HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE
    KOIKE, H
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (01): : 67 - 67
  • [39] TEXTURAL　TRANSFORMATION　OF　KAOLINITEBAUXITIC　MINERALS　UNDER　A　HIGH　RESOLUTION　TRANSMISSION　ELECTRON　MICROSCOPE（HRTEM）
    Dameng Liu (Coal Geology Research Division
    [J]. Scientia Geologica Sinica, 1996, (01) : 55 - 60
  • [40] High-Resolution Imaging and Spectroscopy at High Pressure: A Novel Liquid Cell for the Transmission Electron Microscope
    Tanase, Mihaela
    Winterstein, Jonathan
    Sharma, Renu
    Aksyuk, Vladimir
    Holland, Glenn
    Liddle, James A.
    [J]. MICROSCOPY AND MICROANALYSIS, 2015, 21 (06) : 1629 - 1638
12345